SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2016 - Zvenigorod, Russian Federation (Monday 3 October 2016)] International Conference on Micro- and Nano-Electronics 2016 - Total ionizing dose effects modeling in common-gate tri-gate FinFETs using Verilog-A
Lukichev, Vladimir F., Rudenko, Konstantin V., Gorbunov, Maxim S., Zebrev, Gennady I.Volume:
10224
Year:
2016
Language:
english
DOI:
10.1117/12.2266864
File:
PDF, 257 KB
english, 2016