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SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2016 - Zvenigorod, Russian Federation (Monday 3 October 2016)] International Conference on Micro- and Nano-Electronics 2016 - Layout-aware simulation of soft errors in sub-100 nm integrated circuits
Lukichev, Vladimir F., Rudenko, Konstantin V., Balbekov, A., Gorbunov, M., Bobkov, S.Volume:
10224
Year:
2016
Language:
english
DOI:
10.1117/12.2266880
File:
PDF, 738 KB
english, 2016