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Ab initio electronic transport study of two-dimensional silicon carbide-based p–n junctions
Zhou, Hanming, Lin, Xiao, Guo, Hongwei, Lin, Shisheng, Sun, Yiwei, Xu, YangVolume:
38
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/38/3/033002
Date:
March, 2017
File:
PDF, 1.42 MB
english, 2017