[IEEE 1997 IEEE Ultrasonics Symposium An International...

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[IEEE 1997 IEEE Ultrasonics Symposium An International Symposium - Toronto, Ont., Canada (5-8 Oct. 1997)] 1997 IEEE Ultrasonics Symposium Proceedings. An International Symposium (Cat. No.97CH36118) - Point defect generation by a jog in screw dislocation as a possible reason for the threshold character of ionic crystals sonoluminescence

Khalack, J., Loktev, V.M.
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Volume:
1
Year:
1997
Language:
english
DOI:
10.1109/ultsym.1997.663075
File:
PDF, 226 KB
english, 1997
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