X-ray photoelectron spectroscopy for identification of...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2016 / 07 Vol. 34; Iss. 4

X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices

Aydogan, Pinar, Polat, Emre O., Kocabas, Coskun, Suzer, Sefik
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4954401
Date:
July, 2016
File:
PDF, 1.84 MB
english, 2016
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