Reflectance dependence of polytetrafluoroethylene on...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2017 / 06 Vol. 856

Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light

Haefner, J., Neff, A., Arthurs, M., Batista, E., Morton, D., Okunawo, M., Pushkin, K., Sander, A., Stephenson, S., Wang, Y., Lorenzon, W.
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Volume:
856
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2017.01.057
Date:
June, 2017
File:
PDF, 729 KB
english, 2017
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