[IEEE 2017 Annual Reliability and Maintainability Symposium...

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[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - Evaluating risk: A revisit of the scales, measurement theory, and statistical analysis controversy

Solomon, J. D., Vallero, Daniel, Benson, Kathryn
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Year:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889729
File:
PDF, 351 KB
english, 2017
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