Critical thickness investigation of MBE-grown GaInAs/GaAs...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2016 / 03 Vol. 34; Iss. 2

Critical thickness investigation of MBE-grown GaInAs/GaAs and GaAsSb/GaAs heterostructures

Maros, Aymeric, Faleev, Nikolai, King, Richard R., Honsberg, Christiana B., Convey, Diana, Xie, Hongen, Ponce, Fernando A.
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4942897
Date:
March, 2016
File:
PDF, 2.17 MB
english, 2016
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