Fundraising September 15, 2024 – October 1, 2024 About fundraising

Microstructural degradation of silicon electrodes during...

Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging

Taiwo, Oluwadamilola O., Paz-García, Juan M., Hall, Stephen A., Heenan, Thomas M.M., Finegan, Donal P., Mokso, Rajmund, Villanueva-Pérez, Pablo, Patera, Alessandra, Brett, Daniel J.L., Shearing, Paul
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
342
Language:
english
Journal:
Journal of Power Sources
DOI:
10.1016/j.jpowsour.2016.12.070
Date:
February, 2017
File:
PDF, 2.68 MB
english, 2017
Conversion to is in progress
Conversion to is failed