Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging
Taiwo, Oluwadamilola O., Paz-García, Juan M., Hall, Stephen A., Heenan, Thomas M.M., Finegan, Donal P., Mokso, Rajmund, Villanueva-Pérez, Pablo, Patera, Alessandra, Brett, Daniel J.L., Shearing, PaulVolume:
342
Language:
english
Journal:
Journal of Power Sources
DOI:
10.1016/j.jpowsour.2016.12.070
Date:
February, 2017
File:
PDF, 2.68 MB
english, 2017