Direct Deembedding of Noise Factors for On-Wafer Noise...

IEEE Transactions on Microwave Theory and Techniques 2017 / 3 Vol. 65; Iss. 3

Direct Deembedding of Noise Factors for On-Wafer Noise Measurement

Chen, Xuesong, Chen, Chih-Hung, Lee, Ryan, Chen, David C., Wu, D. Y.
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2016.2627555
Date:
March, 2017
File:
PDF, 1.80 MB
english, 2017
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