![](/img/cover-not-exists.png)
Nitride Semiconductors (Handbook on Materials and Devices) || Topological Analysis of Defects in Nitride Semiconductors
Ruterana, Pierre, Albrecht, Martin, Neugebauer, JörgVolume:
10.1002/35
Year:
2003
Language:
english
DOI:
10.1002/3527607641.ch7
File:
PDF, 1.55 MB
english, 2003