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High-throughput atomic force microscopes operating in parallel
Sadeghian, Hamed, Herfst, Rodolf, Dekker, Bert, Winters, Jasper, Bijnagte, Tom, Rijnbeek, RamonVolume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4978285
Date:
March, 2017
File:
PDF, 27.19 MB
english, 2017