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[IEEE 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - Hyderabad, India (2017.1.7-2017.1.11)] 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - Within-Die Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator
Jain, Poorvi, Das, Bishnu PrasadYear:
2017
Language:
english
DOI:
10.1109/VLSID.2017.23
File:
PDF, 558 KB
english, 2017