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[IEEE 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - Hyderabad, India (2017.1.7-2017.1.11)] 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - A 6V to 42V High Voltage CMOS Bandgap Reference Robust to RF Interference for Automotive Applications
Nyshadham, Sanjeev, Kanth, A. G. KrishnaYear:
2017
Language:
english
DOI:
10.1109/VLSID.2017.28
File:
PDF, 969 KB
english, 2017