[IEEE 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - Hyderabad, India (2017.1.7-2017.1.11)] 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model
Raiola, Pascal, Erb, Dominik, Reddy, Sudhakar M., Becker, BerndYear:
2017
Language:
english
DOI:
10.1109/VLSID.2017.34
File:
PDF, 342 KB
english, 2017