[IEEE 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - Hyderabad, India (2017.1.7-2017.1.11)] 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) - ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis
Shankar, Bhawani, Soni, Ankit, Singh, Manikant, Soman, Rohith, Bhat, K. N., Raghavan, Srinivasan, Bhat, Navakanta, Shrivastava, MayankYear:
2017
DOI:
10.1109/VLSID.2017.57
File:
PDF, 3.72 MB
2017