Origins of Highly Stable Al-evaporated Solution-processed...

Scientific Reports 2015 / 12 Vol. 5; Iss. 1

Origins of Highly Stable Al-evaporated Solution-processed ZnO Thin Film Transistors: Insights from Low Frequency and Random Telegraph Signal Noise

Kim, Joo Hyung, Kang, Tae Sung, Yang, Jung Yup, Hong, Jin Pyo
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Volume:
5
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep16123
Date:
December, 2015
File:
PDF, 1.15 MB
english, 2015
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