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[IEEE 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) - Hamilton, New Zealand (2016.12.6-2016.12.9)] 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) - Masking Soft Errors with Static Bitwise Analysis
Xu, Jianjun, Meng, Xiankai, Tan, Qingping, Xue, JinglingYear:
2016
Language:
english
DOI:
10.1109/APSEC.2016.047
File:
PDF, 243 KB
english, 2016