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[IEEE 2016 International Conference on Advances in Electrical, Electronic and Systems Engineering (ICAEES) - Putrajaya, Malaysia (2016.11.14-2016.11.16)] 2016 International Conference on Advances in Electrical, Electronic and Systems Engineering (ICAEES) - Evaluation of threshold current density of electromigration damage considering passivation thickness
Kikuchi, Hiroki, Sasagawa, Kazuhiko, Fujisaki, KazuhiroYear:
2016
Language:
english
DOI:
10.1109/ICAEES.2016.7888035
File:
PDF, 341 KB
english, 2016