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Analysis of reliability of semiconductor emitters with different designs of cavities
Ivanov, A. V., Kurnosov, V. D., Kurnosov, K. V., Kurnyavko, Yu. V., Lobintsov, A. V., Meshkov, A. S., Penkin, V. N., Romantsevich, V. I., Uspenskii, M. B., Chernov, R. V.Volume:
61
Language:
english
Journal:
Technical Physics
DOI:
10.1134/s1063784216100157
Date:
October, 2016
File:
PDF, 624 KB
english, 2016