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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices || Monte-Carlo Simulation Methods
Nakamura, Takashi, Baba, Mamoru, Ibe, Eishi, Yahagi, Yasuo, Kameyama, HideakiVolume:
10.1142/66
Year:
2008
Language:
english
DOI:
10.1142/9789812778826_0006
File:
PDF, 497 KB
english, 2008