Spectroscopic ellipsometry and X-ray diffraction studies on...

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Spectroscopic ellipsometry and X-ray diffraction studies on Si 1-x Ge x /Si epifilms and superlattices

Xie, Deng, Qiu, Zhi Ren, Wan, Lingyu, Talwar, Devki N., Cheng, Hung-Hsiang, Liu, Shiyuan, Mei, Ting, Feng, Zhe Chuan
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.03.066
Date:
March, 2017
File:
PDF, 1.00 MB
english, 2017
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