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A Brief Overview of SiC MOSFET Failure Modes and Design Reliability
Nel, B.J., Perinpanayagam, S.Volume:
59
Year:
2017
Language:
english
Journal:
Procedia CIRP
DOI:
10.1016/j.procir.2016.09.025
File:
PDF, 876 KB
english, 2017