Synergetic effects during sputter-assisted depth profiling:...

Synergetic effects during sputter-assisted depth profiling: Growth-dominated topography development on InP and a model of the atomic mechanism

Werner H. Gries, Klaus Miethe
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Volume:
91
Year:
1987
Language:
english
Pages:
9
DOI:
10.1007/bf01199493
File:
PDF, 1.40 MB
english, 1987
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