![](/img/cover-not-exists.png)
Application of work function measurements to the characterization of thin films and solid surfaces
Gerd Bachmann, Jörg Scholtes, Hans OechsnerVolume:
91
Year:
1987
Language:
english
Pages:
8
DOI:
10.1007/bf01199523
File:
PDF, 570 KB
english, 1987