Application of work function measurements to the...

Application of work function measurements to the characterization of thin films and solid surfaces

Gerd Bachmann, Jörg Scholtes, Hans Oechsner
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Volume:
91
Year:
1987
Language:
english
Pages:
8
DOI:
10.1007/bf01199523
File:
PDF, 570 KB
english, 1987
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