Rapid measurement of low-order aberrations using Fourier...

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Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams

Kimoto, Koji, Ishizuka, Kazuo
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Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.03.021
Date:
March, 2017
File:
PDF, 1.29 MB
english, 2017
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