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Characterization of negative bias-illumination-stress stability for transparent top-gate In-Ga-Zn-O thin-film transistors with variations in the incorporated oxygen content
Kim, Kyeong-Ah, Park, Min-Ji, Lee, Won-Ho, Yoon, Sung-MinVolume:
118
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4938013
Date:
December, 2015
File:
PDF, 4.63 MB
english, 2015