Observation of in situ...

Journal of Applied Physics 2016 / 11 Vol. 120; Iss. 20

Observation of in situ oxidation dynamics of vanadium thin film with ambient pressure X-ray photoemission spectroscopy

Kim, Geonhwa, Yoon, Joonseok, Yang, Hyukjun, Lim, Hojoon, Lee, Hyungcheol, Jeong, Changkil, Yun, Hyungjoong, Jeong, Beomgyun, Crumlin, Ethan, Lee, Jouhahn, Lee, Jaeyoung, Ju, Honglyoul, Mun, Bongjin S
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Volume:
120
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4967994
Date:
November, 2016
File:
PDF, 1.94 MB
english, 2016
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