Twin domain imaging in topological insulator Bi...

Twin domain imaging in topological insulator Bi 2 Te 3 and Bi 2 Se 3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

Kriegner, Dominik, Harcuba, Petr, Veselý, Jozef, Lesnik, Andreas, Bauer, Guenther, Springholz, Gunther, Holý, Václav
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Volume:
50
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576717000565
Date:
April, 2017
File:
PDF, 2.10 MB
english, 2017
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