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[IEEE 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) - Pensacola Beach, FL, USA (2016.9.28-2016.9.30)] 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) - Thin MLCC (multi-layer ceramic capacitor) reliability evaluation using an accelerated ramp voltage test
Scarpulla, John, Ayvazian, Talin, Buell, Walter, Campbell, Megan, Dubitsky, Andrei, Lin, Rebecca, Martin, Wayne, Moss, Steven, Nuccio, Scott, Yarbrough, Allyson, Young, JeremyYear:
2016
Language:
english
DOI:
10.1109/ASTR.2016.7762295
File:
PDF, 1.10 MB
english, 2016