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IEEE Transactions on Nuclear Science 2017

Fault Modeling and Worst-Case Test Vector Generation for Flash-Based FPGA’s Exposed to Total Dose

Abou-Auf, Ahmed, Abdel-Azizz, Mostafa, Abdel-Azizz, Mai, Amer, Adel
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2687982
File:
PDF, 565 KB
english, 2017
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