Analysis of SEL on Commercial SRAM Memories and Mixed-Field...

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IEEE Transactions on Nuclear Science 2017

Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit For LEO Space Applications

Secondo, Raffaello, Alia, Ruben, Peronnard, Paul, Brugger, Markus, Masi, Alessandro, Danzeca, Salvatore, Merlenghi, Anne-Sophie, Dusseau, Laurent, Vaille, Jean-Roch
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2691403
File:
PDF, 879 KB
english, 2017
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