[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - FMECA-based analyses: A SMART foundation
Dukes, T. Jason, Schmidt, Blair M., Yu, YangyangYear:
2017
Language:
english
DOI:
10.1109/ram.2017.7889723
File:
PDF, 512 KB
english, 2017