Potential of Fault-Detection Coverage by means of On-Chip...

Potential of Fault-Detection Coverage by means of On-Chip Redundancy - IEC61508: Are There Royal Roads to SIL 4?

KANEKAWA, Nobuyasu
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Volume:
E96.D
Year:
2013
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.e96.d.1907
File:
PDF, 1.20 MB
english, 2013
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