Repetitive Short-Circuit Tests on SiC VMOS Devices

Berthou, Maxime, Bevilacqua, Pascal, Fonder, Jean Baptiste, Tournier, Dominique

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Volume:

858

Language:

english

Journal:

Materials Science Forum

DOI:

10.4028/www.scientific.net/msf.858.812

Date:

May, 2016

File:

PDF, 1.08 MB

english, 2016

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