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Effect of Rapid Thermal Annealing on the Structural Evolution and Electrical Property of Gold Films Deposited on Silicon
Janardhanam, V., Choi, Chel JongVolume:
730
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.730.97
Date:
February, 2017
File:
PDF, 394 KB
english, 2017