A direct electron detector for time-resolved MeV electron microscopy
Vecchione, T., Denes, P., Jobe, R. K., Johnson, I. J., Joseph, J. M., Li, R. K., Perazzo, A., Shen, X., Wang, X. J., Weathersby, S. P., Yang, J., Zhang, D.Volume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4977923
Date:
March, 2017
File:
PDF, 15.54 MB
english, 2017