[IEEE 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) - Hamilton, New Zealand (2016.12.6-2016.12.9)] 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) - Dataset Coverage for Testing Machine Learning Computer Programs
Nakajima, Shin, Bui, Hai NgocYear:
2016
Language:
english
DOI:
10.1109/APSEC.2016.049
File:
PDF, 204 KB
english, 2016