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[IEEE 2016 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2016) - Portland, OR, USA (2016.7.11-2016.7.15)] 2016 IEEE Radiation Effects Data Workshop (REDW) - Single Event Testing of SDRAM, DDR2 and DDR3 Memories
Guertin, Steven M., Amrbar, MehranYear:
2016
Language:
english
DOI:
10.1109/NSREC.2016.7891742
File:
PDF, 434 KB
english, 2016