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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Applications of Digital Image Processing XXXIX - Fast estimate of Hartley entropy in image sharpening
Tescher, Andrew G., Krbcová, Zuzana, Kukal, Jaromír, Svihlik, Jan, Fliegel, KarelVolume:
9971
Year:
2016
Language:
english
DOI:
10.1117/12.2237743
File:
PDF, 447 KB
english, 2016