[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - Risk assessment of new programs as a basis for reliability planning
Bartos, Jim, Thomas, Mathew, Roter, MarkYear:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889716
File:
PDF, 717 KB
english, 2017