Resistive switching properties of polycrystalline HfO x N y films by plasma-enhanced atomic layer deposition
Yu, Jue, Huang, Wei, Lu, Chao, Lin, Guangyang, Li, Cheng, Chen, Songyan, Wang, Jianyuan, Xu, Jianfang, Liu, Chunli, Lai, HongkaiVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.050304
Date:
May, 2017
File:
PDF, 1.34 MB
english, 2017