Investigation of frequency and voltage dependence surface states and series resistance profiles using admittance measurements in Al/p-Si with Co 3 O 4 -PVA interlayer structures
Bilkan, Çiğdem, Altındal, Şemsettin, Azizian-Kalandaragh, YasharVolume:
515
Language:
english
Journal:
Physica B: Condensed Matter
DOI:
10.1016/j.physb.2017.04.002
Date:
June, 2017
File:
PDF, 810 KB
english, 2017