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[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - Linking design reviews with FMEA to quickly mitigate the risk of change…design review based on failure modes
Haughey, BillYear:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889706
File:
PDF, 931 KB
english, 2017