Aberration Corrected High Angle Annular Dark Field (HAADF)...

Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs)

Wang, Jinguo, Lu, Ning, Pablo Oviedo, Juan, Peng, Xin, Lian, Guoda, Kim, Moon J.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615002950
Date:
August, 2015
File:
PDF, 197 KB
english, 2015
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