High resolution x-ray diffraction methodology for the...

Journal of Applied Physics 2012 / 07 Vol. 112; Iss. 1

High resolution x-ray diffraction methodology for the structural analysis of one-dimensional nanostructures

Martínez-Tomás, M. C., Montenegro, D. N., Sallet, V., Muñoz-Sanjosé, V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
112
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4730403
Date:
July, 2012
File:
PDF, 2.43 MB
english, 2012
Conversion to is in progress
Conversion to is failed