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Surface roughness estimation of MBE grown CdTe/GaAs(211)B by ex-situ spectroscopic ellipsometry
Karakaya, Merve, Bilgilisoy, Elif, Arı, Ozan, Selamet, YusufVolume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4959223
Date:
July, 2016
File:
PDF, 5.30 MB
english, 2016