Ptychographic microscopy via wavelength scanning

APL Photonics 2017 / 05 Vol. 2; Iss. 5

Ptychographic microscopy via wavelength scanning

Bai, Yeran, Vettil, Suhas.P., Pan, Xingchen, Liu, Cheng, Zhu, Jianqiang
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Volume:
2
Language:
english
Journal:
APL Photonics
DOI:
10.1063/1.4979512
Date:
May, 2017
File:
PDF, 19.81 MB
english, 2017
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