Measuring true localization accuracy in super resolution...

New Journal of Physics 2017 / 02 Vol. 19; Iss. 2

Measuring true localization accuracy in super resolution microscopy with DNA-origami nanostructures

Reuss, Matthias, Fördős, Ferenc, Blom, Hans, Öktem, Ozan, Högberg, Björn, Brismar, Hjalmar
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Volume:
19
Language:
english
Journal:
New Journal of Physics
DOI:
10.1088/1367-2630/aa5f74
Date:
February, 2017
File:
PDF, 1.05 MB
english, 2017
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