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Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering
Tardif, Samuel, Gassenq, Alban, Guilloy, Kevin, Pauc, Nicolas, Osvaldo Dias, Guilherme, Hartmann, Jean-Michel, Widiez, Julie, Zabel, Thomas, Marin, Esteban, Sigg, Hans, Faist, Jérôme, Chelnokov, AlexeVolume:
49
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576716010347
Date:
October, 2016
File:
PDF, 1.30 MB
english, 2016